User Portlet

I am a metrologist with both theoretical/mathematical and experimental/technological backgrounds. My main interest was the development of knowhow and measurement technologies to realize a kilogram definition based on the Planck constant by counting Si atoms. I have expertise in physics, mathematics, precision measurements, length metrology, measurement and control of atomic-scale displacements, dynamical theory of x-ray propagation in crystals, optical and x-ray interferometry and diffractometry, Fourier optics, automatic controls, data analysis, classical and Bayesian statistics, stochastics processes and spectral analysis, cryptanalysis (GF(2) algebra, Boolean satisfiability, and Hellman tradeoff), numerical computation and programming.