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Cross sections for ionization-assisted electron knock-on damage of hBN

Toma Susi, University of Vienna
Posted 6 months ago

scanning transmission electron microscopy (STEM) images showing an hBN sample at different magnifications. Plot of reduction of the displacement threshold energy as a function of charge constrained on the ejecting element. Plot of displacement cross sections for boron.

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POSTED BY: Toma Susi
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